IEC 61967-6:2002/COR1:2010
Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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About This Item
IEC 61967-6:2002/COR1:2010 is a corrigendum linked to the parent document IEC 61967-6:2002, addressing the measurement of electromagnetic emissions from integrated circuits using the magnetic probe method. For engineering teams, laboratories, and compliance groups, it matters because even a correction can affect how a technical document is interpreted in testing workflows, documented evaluation, and conformity assessment preparation. Used alongside the parent reference, it supports more consistent EMC-related review of conducted emissions in the 150 kHz to 1 GHz range.
Overview of IEC 61967-6:2002/COR1:2010
This corrigendum is part of the IEC 61967-6 series on integrated circuits and focuses on the measurement of conducted emissions by magnetic probe method. As a supporting document, IEC 61967-6:2002/COR1:2010 is relevant when organizations need to verify that the parent publication is being applied with the correct technical wording or corrected details. It is typically used in technical review, laboratory evaluation, and engineering documentation where electromagnetic emission testing of integrated circuits must be interpreted carefully.
Compliance applications of IEC 61967-6:2002/COR1:2010
In practical compliance workflows, this corrigendum may be consulted by test laboratories, semiconductor developers, and procurement or quality teams reviewing an EMC document for integrated circuit emission measurements. It is most useful when a project depends on the parent method for conducted emissions assessment and the organization wants a reliable compliance reference for reporting, verification activities, or technical validation. In regulated or customer-driven programs, even a corrigendum can help maintain alignment across testing standards and internal quality workflows.
Importance of compliance with IEC 61967-6:2002/COR1:2010
Using the corrected reference helps reduce ambiguity in technical assessment and supports more consistent measurement practice across different laboratories or product evaluation programs. For EMC-related work, that consistency can matter for risk management, procurement review, and regulatory preparation, especially when results are used to support engineering sign-off or conformity assessment. IEC 61967-6:2002/COR1:2010 therefore serves as a practical support document for teams that need dependable documentation and traceable compliance workflows.
- Supporting corrigendum connected to IEC 61967-6:2002 for magnetic probe-based conducted emission measurement
- Relevant to integrated circuit EMC testing and interpretation of emission-related documentation
- Useful for laboratories, engineering teams, and compliance reviewers maintaining testing consistency
- Helps align technical validation, reporting, and conformity assessment preparation with the corrected text
- Publication Date: 2010-08-30
- Standard Status: Corrigendum
- Publisher: IEC
- Edition: 1
- This Version: IEC 61967-6:2002 (2010-08-30)
- Previous Version: IEC 61967-6:2002 (2008-12-03)
- Previous Version: IEC 61967-6:2002 (2002-06-25)
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