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IEEE 1671.1-2009

Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

Standard by IEEE, 2009

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About This Item

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1671.1-2009 defines the use of Automatic Test Markup Language (ATML) for exchanging automatic test equipment and test information via XML, with a focus on exchanging test descriptions. This standard is relevant where test data must move between systems in a consistent, machine-readable form, helping improve interoperability and reduce ambiguity in electronic and systems testing workflows. For organizations working with components, circuits, devices, and power-related systems, 1671.1-2009 can support clearer test documentation and more reliable exchange of technical information.

About 1671.1-2009

This technical document addresses a specific part of ATML: the structure and exchange of test descriptions using XML. In practice, that means it helps define how automatic test information can be represented so that different tools and test environments can interpret it more consistently. The scope is centered on test description exchange rather than general product design, making 1671.1-2009 useful in environments where test content must be shared, reviewed, or reused across automated test equipment and related engineering systems.

Where is 1671.1-2009 used?

1671.1-2009 is typically used in automated test environments where test descriptions need to be transferred between engineering tools, test controllers, and support systems. It is relevant to test development, test program exchange, and documentation workflows for electronic components, circuits, devices, and system-level equipment. In power, energy, and industrial applications, it may help teams manage structured test information for equipment verification, maintenance support, and configuration control across different platforms.

Importance in practice

In practice, this standard matters because consistent test-description exchange can reduce manual re-entry, interpretation errors, and mismatches between test systems. For procurement, qualification, and ongoing test operations, a defined XML-based approach can improve traceability and make compliance checks more straightforward. By supporting a common format for automatic test information, 1671.1-2009 helps organizations maintain better control over test definitions, improve repeatability, and lower the risk of inconsistent results across tools and sites.

  • ATML test description exchange
  • XML-based test information structure
  • Automatic test equipment interoperability
  • Electronic and power-system testing workflows
  • Superseded standard reference
SKU: 036a7689ac4f

  • Publication Date: 2009
  • Standard Status: Superseded
  • Publisher: IEEE
  • Subject: Components, Circuits, Devices and Systems; Power, Energy and Industry Applications
  • Official IEEE: Doi link
  • New Version Available: 1671.1 (2024)
  • Previous Version: 1671.1 (2018)
  • This Version: 1671.1 (2009)

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