IEEE 1671.1-2017/Cor 1-2023
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1
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About This Item
IEEE 1671.1-2017/Cor 1-2023 is a corrective standard for Automatic Test Markup Language (ATML) Test Descriptions, addressing technical details used in computing and processing environments. It matters because ATML test descriptions help define test intent and structure in a machine-readable way, supporting clearer exchange of test information across systems. This corrigendum helps align the specification with the intended requirements, which can improve consistency for engineers, integrators, and organizations working with automated test data.
Overview of IEEE 1671.1-2017/Cor 1-2023
This document applies to the ATML Test Descriptions portion of the IEEE 1671.1 family and provides a corrigendum to the 2017 edition. In practical terms, IEEE 1671.1-2017/Cor 1-2023 is used to refine the technical language and requirements associated with describing tests in a structured format. The standard is relevant where precise data representation, interoperability, and controlled exchange of test description information are important within computing and processing workflows.
Typical use cases
IEEE 1671.1-2017/Cor 1-2023 is typically consulted when creating, reviewing, or exchanging ATML test descriptions for automated test systems and related software tools. It may be used in test engineering workflows where standardized test documentation needs to be parsed, validated, or shared between platforms. Common use cases include equipment qualification, test program maintenance, and integration of test data models in environments that depend on structured technical descriptions rather than informal documentation.
Why it matters
For organizations that rely on automated testing, this standard helps reduce ambiguity in how test descriptions are written and interpreted. Using IEEE 1671.1-2017/Cor 1-2023 can support better consistency across teams, improve compatibility between tools, and reduce rework caused by unclear or outdated test definitions. It also supports compliance and procurement decisions by giving buyers and engineers a clearer reference for the expected structure and meaning of ATML test description content.
- ATML test description corrigendum
- Structured test information exchange
- Automated test system documentation
- Technical consistency and validation
- Publication Date: 2024
- Standard Status: Active
- Publisher: IEEE
- Subject: Computing and Processing
- Official IEEE: Doi link
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