IEEE 61671-2012
IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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- Language: English
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About This Item
IEEE 61671-2012 defines the Automatic Test Markup Language (ATML) framework for exchanging automatic test equipment and test information via XML. It is aimed at improving how test data, equipment descriptions, and related technical content are structured and shared across engineering workflows. For organizations working with components, circuits, devices, systems, and power or electromagnetics applications, this standard can help support more consistent test interoperability and clearer information exchange.
About IEEE 61671-2012
IEEE 61671-2012 is an English-language technical standard aligned with IEC 61671:2012(E) and IEEE Std 1671-2010. It provides a structured XML-based approach for representing automatic test information so that different test systems can communicate more effectively. The standard is especially relevant where test descriptions, results, and equipment data need to be exchanged in a defined format. As a product-page item, IEEE 61671-2012 helps buyers identify the exact document used to support test data consistency and system integration.
Where is IEEE 61671-2012 used?
This standard is typically used in automatic test environments where test equipment and test information must be exchanged between tools, platforms, or organizations. That may include engineering labs, manufacturing test stations, validation teams, and systems that handle electronic components, circuits, or device-level test data. Because it uses XML to organize ATML content, IEEE 61671-2012 is relevant when teams need a common structure for describing tests, collecting results, or moving information between test execution and data management systems.
Importance in practice
In practice, IEEE 61671-2012 supports better consistency in automated testing by reducing ambiguity in how test information is recorded and exchanged. That can improve coordination between design, verification, and production test groups, while also helping control documentation quality during procurement or compliance reviews. For organizations managing complex test workflows, the standard may reduce integration issues and support more repeatable handling of test assets, results, and equipment definitions across related systems.
- ATML XML data exchange
- Automatic test equipment interoperability
- Test information structuring
- Engineering and validation workflows
- Consistent test documentation
- Publication Date: 2012
- Standard Status: Active
- Publisher: IEEE
- Subject: Components, Circuits, Devices and Systems; Power, Energy and Industry Applications; Fields, Waves and Electromagnetics
- Official IEEE: Doi link
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