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IEEE 61671-5-2016

Automatic Test Markup Language (ATML) Test Adapter Description

Standard by IEEE, 2016

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  • Language: English
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About This Item

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61671-5-2016 defines requirements for Automatic Test Markup Language (ATML) test adapter description within the computing and processing domain. It helps structure how test adapters are described so automated test environments can exchange and interpret information consistently. For teams working with test equipment integration, the standard supports clearer configuration, better interoperability, and more reliable test preparation. As a result, 61671-5-2016 is useful wherever formal test descriptions need to be managed with precision.

What is 61671-5-2016?

61671-5-2016 is a technical standard focused on the ATML test adapter description model. In practical terms, it supports a common way to represent how a test adapter fits into an automated test setup, including the information needed to identify and use it correctly. This is especially relevant in computing and processing environments where test assets must be described in a structured, machine-readable form. The standard helps reduce ambiguity when sharing test-related data across tools and systems.

Where is 61671-5-2016 used?

This standard is typically used in automated testing workflows where adapters connect test systems to the item under test. It may apply in test laboratories, integration environments, and engineering teams that manage test assets through software. 61671-5-2016 is relevant when test descriptions must support consistent exchange between tools, configuration records, and validation processes. It is most useful in settings that rely on ATML-based documentation for test setup, execution, and traceability.

Why is 61671-5-2016 important?

Clear adapter description is important because automated test systems depend on accurate information to function as intended. 61671-5-2016 supports consistency in how test adapters are defined, which can improve procurement review, configuration control, and test repeatability. It also helps reduce misunderstandings during integration and maintenance by giving teams a shared technical reference. For organizations managing complex test environments, this standard can contribute to better quality control and lower risk of setup errors.

  • ATML test adapter description
  • Automated test information exchange
  • Computing and processing context
  • Configuration and traceability support
  • Structured test environment documentation
SKU: f89004235014

  • Publication Date: 2016
  • Standard Status: Active
  • Publisher: IEEE
  • Subject: Computing and Processing
  • Official IEEE: Doi link
  • New Version Available: 61671 (2016)
  • Previous Version: 61671 (2016)
  • This Version: 61671 (2016)
  • Previous Version: 61671 (2016)
  • Previous Version: 61671 (2012)

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