Historical

SAE J1752/2_199503

Name: SAE J1752/2_199503 PDF | Request Standard
SKU: ce6f6f62788c

ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS DIAGNOSTIC PROCEDURE 1 MHZ TO 1000 MHZ, MAGNETIC FIELD—LOOP PROBE

Standard by SAE International, 1995-03-01

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SAE J1752/2_199503.PDFSecure PDF
SAE J1752/2_199503.PDFOnline Access

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Language: English
License Type: Single User
Updates: Not Included

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Language: English
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About This Item

This SAE Recommended Practice defines a method for evaluating the near field magnetic component of the electromagnetic radiation from an integrated circuit. The method uses a shielded, single turn loop as a probe to measure magnetic emissions from 1 to 1000 MHz at a controlled distance and orientation from an integrated circuit. The method primarily measures the magnetic field generated by IC current loops perpendicular to the IC surface in the lead frame. This document is applicable to measurements from an individual IC mounted on a standardized test board or in-situ on a circuit board. Comparisons using the IC emissions reference levels require using identical circuit boards or the standardized IC test board.

SKU: ce6f6f62788c

Publication Date: 1995-03-01

Standard Status: historical

Publisher: SAE International

Document Type: Ground Vehicle Standard

Subject: Integrated circuits, Electromagnetic compatibility, Emissions, Magnetic materials, , , , ,

Official SAE: Doi link

New Version Available: J1752/2_201609 (2016-09-16)
Previous Version: J1752/2_201106 (2011-06-24)
Previous Version: J1752/2_200301 (2003-01-21)
This Version: J1752/2_199503 (1995-03-01)

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