Historical

SAE J1752/2_200301

Name: SAE J1752/2_200301 PDF | Request Standard
SKU: 4c74f781e3ab

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

Standard by SAE International, 2003-01-21

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SAE J1752/2_200301.PDFSecure PDF
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Language: English
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Language: English
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About This Item

This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used. This diagnostic procedure is intended for IC architectural analysis including functional floor plan and power distribution.

SKU: 4c74f781e3ab

Publication Date: 2003-01-21

Standard Status: historical

Publisher: SAE International

Document Type: Ground Vehicle Standard

Subject: Integrated circuits, Emissions, , , , , , ,

Official SAE: Doi link

New Version Available: J1752/2_201609 (2016-09-16)
Previous Version: J1752/2_201106 (2011-06-24)
This Version: J1752/2_200301 (2003-01-21)
Previous Version: J1752/2_199503 (1995-03-01)

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