IEC 60191-2:1966/AMD18:2011
Amendment 18 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
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About This Item
IEC 60191-2:1966/AMD18:2011 is an amendment to the Mechanical standardization of semiconductor devices - Part 2: Dimensions, providing a controlled update to the parent document IEC 60191-2:1966. It is relevant for organizations that rely on precise device dimension references in engineering documentation, procurement review, and conformity assessment. By linking design intent to a maintained technical document, it supports documented evaluation, technical review, and more consistent verification activities across semiconductor component workflows.
IEC 60191-2:1966/AMD18:2011 standard overview
This amendment forms part of the mechanical standardization framework for semiconductor devices and is concerned with dimensions, which are critical for package compatibility, drawing interpretation, and dimensional control. As a modifying reference, IEC 60191-2:1966/AMD18:2011 should be used alongside the parent publication when assessing updated requirements or confirmed dimensional details. For engineering teams, it helps maintain technical consistency in design records, product evaluation, and compliance workflows where semiconductor device dimensions must be clearly defined.
Applications of IEC 60191-2:1966/AMD18:2011
IEC 60191-2:1966/AMD18:2011 is typically consulted in semiconductor component development, mechanical package review, and procurement checks where dimensional alignment affects fit, interchangeability, or assembly planning. It may also support laboratory evaluation, drawing verification, and quality workflows that depend on stable reference dimensions for devices used in electronics manufacturing. In regulated or customer-facing programs, the amendment can be part of a technical documentation set used to confirm that design and supplied parts remain aligned with the parent dimensional specification.
Why IEC 60191-2:1966/AMD18:2011 matters
This amendment matters because dimensional standardization helps reduce integration risk, support interoperability, and improve consistency in semiconductor device selection and validation. When organizations perform technical assessment or conformity assessment preparation, a controlled amendment helps ensure that the latest referenced details are considered rather than relying on outdated drawings alone. It can also improve procurement confidence and engineering validation by giving teams a clearer basis for comparing device packages, reviewing supplier documentation, and maintaining technical compliance across product lifecycles.
- Supports updated dimensional reference control for semiconductor device documentation
- Helps align engineering drawings, package reviews, and supplier data
- Useful for verification activities, procurement checks, and quality assurance records
- Acts as a supporting reference to the parent document rather than a standalone specification
- Publication Date: 2011-11-22
- Standard Status: Amendment
- Publisher: IEC
- Edition: 1
- New Version Available: IEC 60191-2:1966 (2020-02-13)
- Previous Version: IEC 60191-2:1966 (2018-12-04)
- Previous Version: IEC 60191-2:1966 (2012-02-10)
- This Version: IEC 60191-2:1966 (2011-11-22)
- Previous Version: IEC 60191-2:1966 (2008-05-27)
- Previous Version: IEC 60191-2:1966 (2007-07-25)
- Previous Version: IEC 60191-2:1966 (2006-07-17)
- Previous Version: IEC 60191-2:1966 (2006-07-17)
- Previous Version: IEC 60191-2:1966 (2006-07-17)
- Previous Version: IEC 60191-2:1966 (2006-03-24)
- Previous Version: IEC 60191-2:1966 (2004-11-23)
- Previous Version: IEC 60191-2:1966 (2004-03-29)
- Previous Version: IEC 60191-2:1966 (2003-11-19)
- Previous Version: IEC 60191-2:1966 (2003-06-27)
- Previous Version: IEC 60191-2:1966 (2002-12-02)
- Previous Version: IEC 60191-2:1966 (2002-10-05)
- Previous Version: IEC 60191-2:1966 (2002-01-05)
- Previous Version: IEC 60191-2:1966 (2001-11-27)
- Previous Version: IEC 60191-2:1966 (2001-08-28)
- Previous Version: IEC 60191-2:1966 (2001-06-20)
- Previous Version: IEC 60191-2:1966 (2001-03-15)
- Previous Version: IEC 60191-2:1966 (1966-01-01)
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