IEC 60191-2:1966/AMD6:2002
Amendment 6 - Mechanical standardization of semiconductor devices. Part 2: Dimensions
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About This Item
IEC 60191-2:1966/AMD6:2002 is an amendment to the mechanical standardization of semiconductor devices, Part 2: Dimensions, and it is relevant when teams need a controlled reference for package sizing and dimensional consistency. As a supporting document to IEC 60191-2:1966, it helps maintain alignment between engineering drawings, device specifications, and procurement records. For organizations involved in technical review, verification activities, or conformity assessment, IEC 60191-2:1966/AMD6:2002 can be an important compliance reference for documenting updates to established dimensional requirements.
Overview of IEC 60191-2:1966/AMD6:2002
This amendment is connected to the parent document IEC 60191-2:1966 and should be understood as a modifying reference rather than a standalone technical specification. Its focus is the dimensional standardization of semiconductor devices, which is typically used to support consistent mechanical interfaces, drawing interpretation, and part comparison. In engineering documentation and quality workflows, it may help teams confirm whether the current dimensional guidance they rely on reflects the amended version of the underlying reference.
Compliance applications of IEC 60191-2:1966/AMD6:2002
Organizations working with semiconductor device procurement, packaging review, or product evaluation may use IEC 60191-2:1966/AMD6:2002 during technical assessment and document control. It is most relevant where dimensional conformity affects assembly fit, supplier qualification, or laboratory evaluation of component samples. In compliance workflows, it can support traceability between product drawings and the governing dimensional reference, especially when teams are preparing verification records or checking whether device dimensions remain aligned with the amended requirements.
Importance of compliance with IEC 60191-2:1966/AMD6:2002
Using the correct amended reference can reduce risk in engineering validation and procurement by improving consistency in how semiconductor device dimensions are interpreted. That matters for interoperability, quality assurance, and testing consistency, particularly when multiple suppliers or revisions are involved. In regulated or controlled environments, the amendment may also support conformity assessment preparation by clarifying which version of the dimensional guidance applies. For operational teams, accurate document selection helps avoid mismatch between specifications, test expectations, and accepted product configurations.
- Dimensional guidance linked to semiconductor device mechanical standardization
- Amendment status tied to the parent reference IEC 60191-2:1966
- Useful for drawing control, part comparison, and supplier documentation review
- Supports technical validation and compliance workflow traceability
- Publication Date: 2002-01-05
- Standard Status: Amendment
- Publisher: IEC
- Edition: 1
- New Version Available: IEC 60191-2:1966 (2020-02-13)
- Previous Version: IEC 60191-2:1966 (2018-12-04)
- Previous Version: IEC 60191-2:1966 (2012-02-10)
- Previous Version: IEC 60191-2:1966 (2011-11-22)
- Previous Version: IEC 60191-2:1966 (2008-05-27)
- Previous Version: IEC 60191-2:1966 (2007-07-25)
- Previous Version: IEC 60191-2:1966 (2006-07-17)
- Previous Version: IEC 60191-2:1966 (2006-07-17)
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- Previous Version: IEC 60191-2:1966 (2006-03-24)
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- Previous Version: IEC 60191-2:1966 (2003-11-19)
- Previous Version: IEC 60191-2:1966 (2003-06-27)
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- This Version: IEC 60191-2:1966 (2002-01-05)
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- Previous Version: IEC 60191-2:1966 (2001-03-15)
- Previous Version: IEC 60191-2:1966 (1966-01-01)
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