IEEE P1671/D11, Jan 2010
IEEE Draft Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment 4 and Test Information via XML
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About This Item
IEEE P1671/D11, Jan 2010 is a draft standard for Automatic Test Markup Language (ATML) for exchanging Automatic Test Equipment and test information via XML. It is aimed at improving how test data is structured and shared across components, circuits, devices, and systems, especially in power, energy, and industry applications. By defining a common XML-based approach, IEEE P1671/D11, Jan 2010 helps support more consistent test integration, data exchange, and engineering workflows.
Overview of IEEE P1671/D11, Jan 2010
This draft specification focuses on the use of ATML to represent test information in a structured, machine-readable format. It is relevant where automatic test equipment must communicate results, setup details, or related test artifacts through XML. IEEE P1671/D11, Jan 2010 is intended to help align test systems with a common exchange format, reducing ambiguity when handling test content across different tools, platforms, or engineering teams.
Typical use cases
IEEE P1671/D11, Jan 2010 may be used in automated test environments where equipment data, test procedures, and result records need to move between test stations or software systems. Typical use includes integration of automatic test equipment, exchange of test information for electrical or electronic assemblies, and support for engineering test documentation. It is especially useful in workflows that depend on repeatable data handling across development, validation, and production test activities.
Why it matters
This standard matters because test data exchange can affect consistency, traceability, and reusability across engineering programs. A defined XML-based format helps reduce interpretation errors and supports more reliable communication between test equipment and associated software. For organizations working with automated testing, IEEE P1671/D11, Jan 2010 can assist with design control, procurement alignment, and test process consistency, while also supporting better comparison of results over time.
- ATML-based test information exchange
- XML structure for automatic test data
- Automatic test equipment integration
- Electrical, device, and system test workflows
- Draft standard status: inactive
- Publication Date: 2010
- Standard Status: Inactive
- Publisher: IEEE
- Subject: Components, Circuits, Devices and Systems; Power, Energy and Industry Applications
- Official IEEE: Doi link
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