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IEEE P1671

IEEE Draft Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

Standard by IEEE, 2010

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  • Language: English
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  • Language: English
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About This Item

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IEEE P1671 is a draft standard for Automatic Test Markup Language (ATML) focused on exchanging automatic test equipment and test information through XML. It addresses how test data, test descriptions, and related equipment information can be represented in a structured form for reliable exchange. For power, energy, and industrial components and systems, this kind of specification can help support clearer interoperability, more consistent test records, and better alignment between test tools and engineering workflows.

About IEEE P1671

IEEE P1671 defines a framework for using XML to communicate information associated with automatic test equipment and test processes. As a draft standard, it is aimed at improving how test content is structured and shared across systems that generate, store, or interpret test data. The technical focus is on Automatic Test Markup Language, which commonly supports machine-readable exchange and reduces ambiguity in test documentation. IEEE P1671 is relevant where consistent representation of test information is needed for engineering, validation, and controlled data handling.

Where is IEEE P1671 used?

This standard is typically associated with environments that rely on automatic test equipment and structured test information exchange. In practice, IEEE P1671 may be used in engineering laboratories, production test setups, maintenance workflows, and data-management systems that handle XML-based test records. Its context fits equipment and systems in power, energy, and industrial applications where test definitions, results, and related metadata need to move between tools with minimal translation. It is especially useful when test information must remain readable and consistent across platforms.

Importance in practice

IEEE P1671 matters because test data that is exchanged in a common XML structure can be easier to validate, compare, and store over time. That can support more consistent testing procedures, fewer interpretation errors, and better control of test documentation across engineering teams and equipment suppliers. For organizations working with automatic test equipment, the standard may help reduce integration risk and improve traceability in compliance-oriented or quality-controlled environments. IEEE P1671 is most valuable where dependable test information exchange supports repeatable results.

  • ATML-based test information exchange
  • XML structure for automatic test equipment data
  • Test descriptions and results handling
  • Engineering and validation workflows
  • Consistency for controlled test records
SKU: 13bcebdbad07

  • Publication Date: 2010
  • Standard Status: Inactive
  • Publisher: IEEE
  • Subject: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
  • Official IEEE: Doi link
  • New Version Available: P1671 (2010)
  • This Version: P1671 (2010)
  • Previous Version: P1671 (2006)
  • Previous Version: P1671 (2006)
  • Previous Version: P1671 (2006)
  • Previous Version: P1671 (2006)

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