IEEE P1671/D4
Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML (Superseded by D5)
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About This Item
P1671/D4 is a technical standard for Automatic Test Markup Language (ATML) used to exchange automatic test equipment and test information via XML. It addresses structured data sharing in test environments, helping engineering teams represent test content and results in a consistent way. For power, energy, and industrial applications, this type of specification can support clearer interoperability between test systems, equipment, and software tools. This edition is inactive and was superseded by D5.
P1671/D4 overview
The P1671/D4 specification defines a framework for using ATML to package and exchange automatic test information in XML format. Its focus is on machine-readable test data rather than physical product characteristics, making it relevant where test procedures, measurements, and outcomes must move between systems without ambiguity. In practice, the standard helps normalize how test-related information is described, stored, and interpreted across automated test equipment and supporting software used in engineering and manufacturing workflows.
Typical use cases
This standard is commonly relevant in automated test environments where test programs, measurements, and results need to be shared between equipment and information systems. It may be used for test development, result archiving, and data exchange in facilities supporting electrical components, circuits, devices, and systems. Organizations working with industrial test setups, production verification, or maintenance diagnostics can use P1671/D4 to structure XML-based test information more consistently across tools and teams.
Why this standard matters
Reliable test-data exchange reduces manual re-entry, supports traceability, and helps limit errors when information moves between automatic test equipment and software platforms. For teams managing compliance, quality control, or repeatable test processes, P1671/D4 can improve consistency in how test information is represented and reviewed. It also supports clearer integration during procurement and system design, where compatibility between test assets and data formats is an important practical concern.
- ATML-based test information exchange
- XML structure for automated test data
- Interoperability between test equipment and software
- Support for engineering and production test workflows
- Inactive edition, superseded by D5
- Publication Date: 2006
- Standard Status: Inactive
- Publisher: IEEE
- Subject: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
- Official IEEE: Doi link
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